SOLUTIONS
High-Speed Bus Test Solution
High-Speed Testing-MIPI Testing
Featuring high bandwidth, low power consumption, and low electromagnetic interference (EMI), MIPI defines and promotes interface standardization for the design of mobile devices…
High-Speed Testing-TCON Testing
TCON (timing controller), normally located on the circuit board below the glass panel, is the only active component inside a TFT-LCD. TCON plays a key role in the control and correction of brightness (HDR)…